MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order this document by MMDF4C03HD/D
Advance Information
Medium Power Surface Mount Products
Complementary TMOS
Field Effect Transistors
MiniMOS devices are an advanced series of power MOSFETs which utilize Motorola's High Cell Density HDTMOS process.
These miniature surface mount MOSFETs feature ultra low RDS(on) and true logic level performance. They are capable of withstanding
high energy in the avalanche and commutation modes and the drain±to±source diode has a very low reverse recovery time. MiniMOS devices are designed for use in low voltage, high speed switching applications where power efficiency is important. Typical applications are dc±dc converters, and power management in portable and battery powered products such as computers, printers, cellular and cordless phones. They can also be used for low voltage motor controls in mass storage products such as disk drives and tape drives.
•Ultra Low RDS(on) Provides Higher Efficiency and Extends Battery Life
•Logic Level Gate Drive Ð Can Be Driven by Logic ICs
•Miniature SO±8 Surface Mount Package Ð Saves Board Space
•Ideal for Synchronous Rectification
•Diode Exhibits High Speed, With Soft Recovery
•IDSS Specified at Elevated Temperature
•Mounting Information for SO±8 Package Provided
P±G
N±G
MMDF4C03HD
Motorola Preferred Device
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P±S
D
N±S
COMPLEMENTARY
DUAL TMOS POWER FET
30 VOLTS
N±CH RDS(on) = 50 mW P±CH RDS(on) = 85 mW
CASE 751±05, Style 11
SO±8
N±Source |
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1 |
8 |
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Drain |
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2 |
7 |
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N±Gate |
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Drain |
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P±Source |
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3 |
6 |
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Drain |
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P±Gate |
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4 |
5 |
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Drain |
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Top View
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating |
Symbol |
Polarity |
Value |
Unit |
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Drain±to±Source Voltage |
VDSS |
Ð |
30 |
Vdc |
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Gate±to±Source Voltage |
VGS |
Ð |
± 20 |
Vdc |
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Drain Current Ð Continuous |
ID |
N±Channel |
5.5 |
Adc |
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P±Channel |
4.4 |
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Drain Current Ð Pulsed |
IDM |
N±Channel |
25 |
Apk |
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P±Channel |
20 |
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Operating and Storage Temperature Range |
TJ, Tstg |
Ð |
±55 to +150 |
°C |
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Total Power Dissipation @ T = 25°C (1) |
P |
D |
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2.5 |
Watts |
A |
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Single Pulse Drain±to±Source Avalanche Energy Ð Starting T J = 25°C |
EAS |
N±Channel |
325 |
mJ |
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(VDD = 30 Vdc, VGS = 5.0 Vdc, IL = 9.0 Apk, L = 10 mH, RG = 25 W) |
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(VDD = 30 Vdc, VGS = 5.0 Vdc, IL = 9.0 Apk, L = 10 mH, RG = 25 W) |
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P±Channel |
450 |
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Thermal Resistance Ð Junction±to±Ambient (1) |
RqJA |
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50 |
°C/W |
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Maximum Lead Temperature for Soldering Purposes, 1/8″ from Case for 10 sec. |
TL |
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260 |
°C |
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DEVICE MARKING |
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D4C03 |
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(1) Mounted on G10/FR4 glass epoxy board using minimum recommended footprint. |
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ORDERING INFORMATION
Device |
Reel Size |
Tape Width |
Quantity |
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MMDF4C03HDR2 |
13″ |
12 mm embossed tape |
2500 |
This document contains information on a new product. Specifications and information herein are subject to change without notice.
HDTMOS and MiniMOS are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc. Thermal Clad is a trademark of the Bergquist Company.
Preferred devices are Motorola recommended choices for future use and best overall value.
REV 1
Motorola TMOS Power MOSFET Transistor Device Data |
1 |
Motorola, Inc. 1997 |
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MMDF4C03HD
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic |
Symbol |
Polarity |
Min |
Typ |
Max |
Unit |
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OFF CHARACTERISTICS |
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Drain±to±Source Breakdown Voltage |
V(BR)DSS |
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Vdc |
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(VGS = 0 Vdc, ID = 0.25 mAdc) |
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Ð |
30 |
Ð |
Ð |
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Zero Gate Voltage Drain Current |
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IDSS |
(N) |
Ð |
Ð |
1.0 |
μAdc |
(VDS = 30 Vdc, VGS = 0 Vdc) |
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(P) |
Ð |
Ð |
1.0 |
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Gate±Body Leakage Current (VGS = ± 20 Vdc, VDS = 0) |
IGSS |
Ð |
Ð |
Ð |
±100 |
nAdc |
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ON CHARACTERISTICS(1) |
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Gate Threshold Voltage (VDS = VGS, ID = 250 μAdc) |
VGS(th) |
Ð |
1.0 |
Ð |
Ð |
Vdc |
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Threshold Temperature Coefficient (Negative) |
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Ð |
Ð |
Ð |
Ð |
mV/°C |
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Drain±to±Source On±Resistance |
(VGS = 10 Vdc, ID = 3.5 Adc) |
RDS(on)1 |
(N) |
Ð |
0.037 |
0.05 |
Ohms |
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(VGS = 10 Vdc, ID = 3.5 Adc) |
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(P) |
Ð |
0.075 |
0.085 |
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Static Drain±to±Source On±Resistance |
RDS(on)2 |
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Ohms |
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(VGS = 4.5 Vdc, ID = 2.5 Adc) |
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(N) |
Ð |
0.55 |
0.08 |
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(VGS = 4.5 Vdc, ID = 2.0 Adc) |
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(P) |
Ð |
0.125 |
0.16 |
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Forward Transconductance |
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gFS |
(N) |
Ð |
9.0 |
Ð |
mhos |
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(VDS = 15 Vdc, ID = 3.5 Adc) |
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(P) |
Ð |
6.0 |
Ð |
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DYNAMIC CHARACTERISTICS |
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Input Capacitance |
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Ciss |
(N) |
Ð |
430 |
600 |
pF |
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(P) |
Ð |
425 |
600 |
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(VDS = 24 Vdc, |
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Output Capacitance |
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Coss |
(N) |
Ð |
217 |
300 |
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VGS = 0 Vdc, |
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(P) |
Ð |
209 |
300 |
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f = 1.0 MHz) |
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Transfer Capacitance |
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Crss |
(N) |
Ð |
67.5 |
135 |
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(P) |
Ð |
57.2 |
80 |
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SWITCHING CHARACTERISTICS(2) |
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Turn±On Delay Time |
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td(on) |
(N) |
Ð |
8.2 |
16.4 |
ns |
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(P) |
Ð |
11.7 |
23.4 |
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Rise Time |
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(VDD = 15 Vdc, |
tr |
(N) |
Ð |
8.48 |
16.9 |
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ID = 1.0 Adc, |
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(P) |
Ð |
15.8 |
31.6 |
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Turn±Off Delay Time |
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VGS = 10 Vdc, |
td(off) |
(N) |
Ð |
89.6 |
179 |
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RG = 6.0 Ω) |
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(P) |
Ð |
167.3 |
334.6 |
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Fall Time |
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tf |
(N) |
Ð |
61.1 |
122 |
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(P) |
Ð |
102.6 |
205.2 |
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Total Gate Charge |
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QT |
(N) |
Ð |
15.7 |
31.4 |
nC |
(See Figure 8) |
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(P) |
Ð |
14.8 |
29.6 |
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(VDS = 10 Vdc, |
Q1 |
(N) |
Ð |
2.0 |
Ð |
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(P) |
Ð |
1.7 |
Ð |
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ID = 3.5 Adc, |
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Q2 |
(N) |
Ð |
4.6 |
Ð |
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VGS = 10 Vdc) |
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(P) |
Ð |
4.7 |
Ð |
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Q3 |
(N) |
Ð |
3.9 |
Ð |
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(P) |
Ð |
3.4 |
Ð |
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SOURCE±DRAIN DIODE CHARACTERISTICS |
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Forward On±Voltage(2) |
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(IS = 1.7 Adc, VGS = 0 Vdc) |
VSD |
(N) |
Ð |
0.77 |
1.2 |
Vdc |
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(IS = ±1.7 Adc, VGS = 0 Vdc) |
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(P) |
Ð |
0.90 |
1.2 |
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Reverse Recovery Time |
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(N) |
trr |
(N) |
Ð |
54.5 |
Ð |
ns |
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(ID = 3.5 Adc, |
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(P) |
Ð |
77.4 |
Ð |
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VGS = 0 Vdc |
ta |
(N) |
Ð |
14.8 |
Ð |
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dIS/dt = 100 A/μs) |
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(P) |
Ð |
19.9 |
Ð |
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(P) |
tb |
(N) |
Ð |
39.7 |
Ð |
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(ID = 3.5 Adc, |
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(P) |
Ð |
57.5 |
Ð |
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Reverse Recovery Stored Charge |
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VGS = 0 Vdc |
QRR |
(N) |
Ð |
0.048 |
Ð |
μC |
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dIS/dt = 100 A/μs) |
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(P) |
Ð |
0.088 |
Ð |
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(1)Pulse Test: Pulse Width ≤ 300 μs, Duty Cycle ≤ 2%.
(2)Switching characteristics are independent of operating junction temperature.
2 |
Motorola TMOS Power MOSFET Transistor Device Data |
MMDF4C03HD
TYPICAL ELECTRICAL CHARACTERISTICS
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N±Channel |
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12 |
10 V |
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3.9 V |
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TJ = 25°C |
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3.7 V |
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6.0 V |
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10 |
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(AMPS) |
4.5 V |
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8.0 |
4.3 V |
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3.5 V |
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CURRENT |
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4.1 V |
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6.0 |
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3.3 V |
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, DRAIN |
4.0 |
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3.1 V |
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2.9 V |
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D |
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I |
2.0 |
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VGS |
= 2.5 V |
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2.7 V |
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0 |
0.2 |
0.4 |
0.6 |
0.8 |
1.0 |
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1.4 |
1.6 |
1.8 |
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0 |
1.2 |
2.0 |
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VDS, DRAIN±TO±SOURCE VOLTAGE (VOLTS) |
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Figure 1. On±Region Characteristics
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12 |
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(AMPS) |
10 |
VDS ≥ |
10 V |
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8.0 |
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CURRENT |
6.0 |
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100°C |
25°C |
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, DRAIN |
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4.0 |
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D |
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TJ = ±55°C |
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I |
2.0 |
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0 |
2.0 |
2.5 |
3.0 |
3.5 |
4.0 |
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1.5 |
4.5 |
5.0 |
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VGS, GATE±TO±SOURCE VOLTAGE (VOLTS) |
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Figure 2. Transfer Characteristics
(OHMS) |
0.30 |
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TJ = 25°C |
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RESISTANCE |
0.25 |
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ID |
= 6 A |
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0.20 |
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, DRAIN±TO±SOURCE |
0.15 |
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0.10 |
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0.05 |
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DS(on) |
0 |
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2.0 |
3.0 |
4.0 |
5.0 |
6.0 |
7.0 |
8.0 |
9.0 |
10 |
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R |
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P±Channel |
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6.0 |
VGS = 10 V |
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TJ = 25°C |
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5.0 |
6.0 V |
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4.1 V |
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(AMPS) |
4.5 V |
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3.9 V |
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4.3 V |
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4.0 |
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CURRENT |
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3.7 V |
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3.0 |
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3.5 V |
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,DRAIN |
2.0 |
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3.3 V |
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3.1 V |
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D |
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I |
1.0 |
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2.9 V |
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2.7 V |
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0 |
0.2 |
0.4 |
0.6 |
0.8 |
1.0 |
1.2 |
1.4 |
1.6 |
1.8 |
2.0 |
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0 |
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VDS, DRAIN±TO±SOURCE VOLTAGE (VOLTS) |
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Figure 1. On±Region Characteristics
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6.0 |
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(AMPS) |
5.0 |
VDS ≥ |
10 V |
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100°C |
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4.0 |
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CURRENT |
3.0 |
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, DRAIN |
2.0 |
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D |
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25°C |
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I |
1.0 |
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TJ = ±55°C |
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0 |
2.0 |
2.5 |
3.0 |
3.5 |
4.0 |
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1.5 |
4.5 |
5.0 |
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VGS, GATE±TO±SOURCE VOLTAGE (VOLTS) |
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Figure 2. Transfer Characteristics
(OHMS) |
0.8 |
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0.7 |
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TJ = 25°C |
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RESISTANCE |
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0.6 |
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ID = 3 A |
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0.5 |
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, DRAIN±TO±SOURCE |
0.4 |
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0.3 |
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0.2 |
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0.1 |
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DS(on) |
0 |
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9.0 |
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2.0 |
3.0 |
4.0 |
5.0 |
6.0 |
7.0 |
8.0 |
10 |
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R |
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VGS, GATE±TO±SOURCE VOLTAGE (VOLTS) |
VGS, GATE±TO±SOURCE VOLTAGE (VOLTS) |
Figure 3. On±Resistance versus |
Figure 3. On±Resistance versus |
Gate±To±Source Voltage |
Gate±To±Source Voltage |
Motorola TMOS Power MOSFET Transistor Device Data |
3 |
MMDF4C03HD
TYPICAL ELECTRICAL CHARACTERISTICS
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N±Channel |
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(OHMS) |
0.050 |
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TJ = 25°C |
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RESISTANCE |
0.045 |
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VGS = 4.5 V |
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0.040 |
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, DRAIN±TO±SOURCE |
0.035 |
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0.030 |
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10 V |
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DS(on) |
0.025 |
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1.0 |
2.0 |
3.0 |
4.0 |
5.0 |
6.0 |
7.0 |
8.0 |
9.0 |
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R |
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ID, DRAIN CURRENT (AMPS) |
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P±Channel |
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(OHMS) |
0.18 |
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0.16 |
TJ = 25°C |
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RESISTANCE |
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0.14 |
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VGS = 4.5 V |
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0.12 |
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DRAIN±TO±SOURCE |
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0.10 |
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0.08 |
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10 V |
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0.06 |
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, |
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DS(on) |
0.04 |
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2.0 |
2.5 |
3.0 |
3.5 |
4.0 |
4.5 |
5.0 |
5.5 |
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1.0 |
1.5 |
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R |
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ID, DRAIN CURRENT (AMPS) |
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Figure 4. On±Resistance versus Drain Current |
Figure 4. On±Resistance versus Drain Current |
and Gate Voltage |
and Gate Voltage |
(NORMALIZED) |
1.8 |
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1.6 |
VGS = 10 V |
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1.4 |
ID = 3 A |
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RESISTANCE |
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1.2 |
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1.0 |
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,DRAIN±TO±SOURCE |
0.8 |
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0.6 |
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0.4 |
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0.2 |
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0 |
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DS(on) |
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0 |
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50 |
75 |
100 |
125 |
150 |
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±50 |
±25 |
25 |
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TJ, JUNCTION TEMPERATURE (°C) |
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R |
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Figure 5. On±Resistance Variation with
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Temperature |
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1000 |
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VGS = 0 V |
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100 |
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TJ = 125°C |
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(nA) |
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, LEAKAGE |
10 |
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100°C |
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DSS |
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I |
1.0 |
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25°C |
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0.1 |
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0 |
5.0 |
10 |
15 |
20 |
25 |
30 |
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VDS, DRAIN±TO±SOURCE VOLTAGE (VOLTS) |
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Figure 6. Drain±To±Source Leakage
Current versus Voltage
(NORMALIZED) |
1.6 |
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1.4 |
VGS = 10 V |
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1.2 |
ID = 1.5 A |
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RESISTANCE |
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1.0 |
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0.8 |
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,DRAIN±TO±SOURCE |
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0.6 |
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0.4 |
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0.2 |
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0 |
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DS(on) |
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0 |
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±50 |
±25 |
25 |
50 |
75 |
100 |
125 |
150 |
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TJ, JUNCTION TEMPERATURE (°C) |
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R |
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Figure 5. On±Resistance Variation with
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Temperature |
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100 |
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VGS = 0 V |
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TJ = 125°C |
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(nA) |
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, LEAKAGE |
10 |
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DSS |
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100°C |
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I |
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1.0 |
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0 |
5.0 |
10 |
15 |
20 |
25 |
30 |
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VDS, DRAIN±TO±SOURCE VOLTAGE (VOLTS) |
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Figure 6. Drain±To±Source Leakage
Current versus Voltage
4 |
Motorola TMOS Power MOSFET Transistor Device Data |
MMDF4C03HD
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals ( t) are determined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculating rise and fall because drain±gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input
current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that
t = Q/IG(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following:
tr = Q2 x RG/(VGG ± VGSP) tf = Q2 x RG/VGSP
where
VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance
and Q2 and VGSP are read from the gate charge curve.
During the turn±on and turn±off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
td(on) = RG Ciss In [VGG/(VGG ± VGSP)] |
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N±Channel |
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1200 |
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TJ = 25°C |
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1000 |
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(pF) |
800 |
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CAPACITANCE |
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600 |
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Ciss |
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400 |
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C, |
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Coss |
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200 |
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Crss |
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0 |
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±10 |
±5.0 |
0 |
5.0 |
10 |
15 |
20 |
25 |
30 |
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VGS |
VDS |
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VDS, DRAIN±TO±SOURCE VOLTAGE (VOLTS) |
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|||||
td(off) = RG Ciss In (VGG/VGSP)
The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off±state condition when cal-
culating td(on) and is read at a voltage corresponding to the on±state when calculating td(off).
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
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P±Channel |
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1000 |
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800 |
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TJ = 25°C |
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(pF) |
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C, CAPACITANCE |
600 |
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Ciss |
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400 |
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Coss |
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200 |
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Crss |
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0 |
±5.0 |
0 |
5.0 |
10 |
15 |
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±10 |
20 |
25 |
30 |
|||||
VGS VDS
VDS, DRAIN±TO±SOURCE VOLTAGE (VOLTS)
Figure 7. Capacitance Variation |
Figure 7. Capacitance Variation |
Motorola TMOS Power MOSFET Transistor Device Data |
5 |